Schottky defects


Schottky defects
Šotkio defektai statusas T sritis chemija apibrėžtis Taškinės katijonų ar anijonų vakansijos. atitikmenys: angl. Schottky defects rus. дефекты Шоттки

Chemijos terminų aiškinamasis žodynas – 2-asis patais. ir papild. leid. – Vilnius: Mokslo ir enciklopedijų leidybos institutas. . 2003.

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  • Schottky defect — A Schottky defect is a type of point defect in a crystal lattice named for Walter H. Schottky. The defect forms when oppositely charged ions leave their lattice sites, creating vacancies. These vacancies are formed in stoichiometric units, to… …   Wikipedia

  • Schottky barrier — A Schottky barrier is a potential barrier formed at a metal semiconductor junction which has rectifying characteristics, suitable for use as a diode. The largest differences between a Schottky barrier and a p n junction are its typically lower… …   Wikipedia

  • Metal oxide adhesion — The strength of metal oxide adhesion effectively determines the wetting of the metal oxide interface. The strength of this adhesion is important, for instance, in production of light bulbs and fiber matrix composites that depend on the… …   Wikipedia

  • Šotkio defektai — statusas T sritis chemija apibrėžtis Taškinės katijonų ar anijonų vakansijos. atitikmenys: angl. Schottky defects rus. дефекты Шоттки …   Chemijos terminų aiškinamasis žodynas

  • дефекты Шоттки — Šotkio defektai statusas T sritis chemija apibrėžtis Taškinės katijonų ar anijonų vakansijos. atitikmenys: angl. Schottky defects rus. дефекты Шоттки …   Chemijos terminų aiškinamasis žodynas

  • Deep-level transient spectroscopy — (DLTS) is an experimental tool for studying electrically active defects (known as charge carrier traps) in semiconductors. DLTS establishes fundamental defect parameters and measures their concentration in the material. Some of the parameters are …   Wikipedia

  • Electron beam induced current — (EBIC) is a semiconductor analysis technique performed in a scanning electron microscope (SEM) or scanning transmission electron microscope (STEM). It is used to identify buried junctions or defects in semiconductors, or to examine minority… …   Wikipedia

  • crystal defect — Crystall. defect (def. 3). * * * ▪ crystallography       imperfection in the regular geometrical arrangement of the atoms in a crystalline solid. These imperfections result from deformation of the solid, rapid cooling from high temperature, or… …   Universalium

  • Crystallographic defect — Crystalline solids exhibit a periodic crystal structure. The positions of atoms or molecules occur on repeating fixed distances, determined by the unit cell parameters. However, the arrangement of atom or molecules in most crystalline materials… …   Wikipedia

  • Silver bromide — chembox new OtherNames = bromargyrite bromyrite silver(I) bromide Section1 = Chembox Identifiers CASNo = 7785 23 1 Section2 = Chembox Properties Formula = AgBr MolarMass = 187.772 g/mol Appearance = Pale yellow solid photosensitive Density =… …   Wikipedia


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